GradNova

Home
Find Faculty
Universities
Research
Home
/
Research
/

Advanced Measurement and Metrology Techniques

Advanced Measurement and Metrology Techniques

2 faculty research Advanced Measurement and Metrology Techniques on GradNova.

L
LianXiang Yang

Distinguished University Professor

Computer Science

Oakland University

Advanced Measurement and Metrology Techniques
Digital Holography and Microscopy
Image Processing Techniques and Applications
Optical Measurement and Interference Techniques
+1
Q
Advanced Measurement and Metrology Techniques
Metal Forming Simulation Techniques
Metallurgy and Material Forming
Microstructure and Mechanical Properties
+1