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Reliable and Testable VLSI Design

Reliable and Testable VLSI Design

1 faculty research Reliable and Testable VLSI Design on GradNova.

M
Mark Tehranipoor

Dean, Intel Charles E. Young Endowed Chair Professor in Cybersecurity

Department of Electrical & Computer Engineering

University of Florida

Electronics Supply Chain Security
Hardware Security and Trust
IoT Security
Reliable and Testable VLSI Design
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