GradNova

Design, Characterization, and Reliability

1 faculty research Design, Characterization, and Reliability on GradNova.

T

Toshikazu Nishida

Professor and Associate Dean for Academic Affairs

Department of Electrical & Computer Engineering

University of Florida

Design, Characterization, and Reliability

Multi-Functional Semiconductor Devices, (sensors, Logic, Actuators, Memory, Mems)

Semiconductor Materials and Devices

Advanced MEMS and NEMS Technologies

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