Atomic Force Microscopy (afm), Transmission Electron Microscopy (tem), X-Ray Diffraction (xrd) and Photoluminescence (pl), Raman Spectroscopy, Ellipsometry, Rutherford Back Scattering, Etc.
1 faculty research Atomic Force Microscopy (afm), Transmission Electron Microscopy (tem), X-Ray Diffraction (xrd) and Photoluminescence (pl), Raman Spectroscopy, Ellipsometry, Rutherford Back Scattering, Etc. on GradNova.
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Atomic Force Microscopy (afm), Transmission Electron Microscopy (tem), X-Ray Diffraction (xrd) and Photoluminescence (pl), Raman Spectroscopy, Ellipsometry, Rutherford Back Scattering, Etc.
Cleanroom-Based Micro/nanofabrication Including Photo- and E-Beam-Lithography, Metallization, and Device Packaging
Experimental Development of Novel Semiconductor Nanostructures for Quantum Information Sciences
Low-Temperature, High-Field Magnetoresistance Quantized Carrier/spin Transport (quantum Hall Effects, Shubnikov-De Haas Oscillations, 1D Quantized Conductance, 0.7 Structure, Etc.)
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